Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7256594 | Method and apparatus for testing semiconductor devices using the back side of a circuit board | Chang-Nyun Kim, Sun-Ju Kim, Jong Hyun Kim, Sang Jun Park | 2007-08-14 |
| 7075325 | Method and apparatus for testing semiconductor devices using an actual board-type product | Sang Jun Park, Chang-Nyun Kim, Hyun-Ho Park, Nam-Sik Jeong, Jong Hyun Kim | 2006-07-11 |
| 6833721 | Method and apparatus for testing semiconductor devices using an actual board-type product | Sang Jun Park, Chang-Nyun Kim, Hyun-Ho Park, Nam-Sik Jeong, Jong Hyun Kim | 2004-12-21 |
| 6771088 | Method and apparatus for testing semiconductor devices using the back side of a circuit board | Chang-Nyun Kim, Sun-Ju Kim, Jong Hyun Kim, Sang Jun Park | 2004-08-03 |
| 6335629 | Test fixture having an opening for exposing the back of a semiconductor chip and testing module comprising the same | Sang Sik Lee, Kye Won Ha, Jong Wook Kim | 2002-01-01 |