Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8587700 | Method of detecting defects in image sensor, tester for the method, and control signal generator for the method | Jun Taek Lee, Kwang Hee Lee, Ji-Hoon Jung | 2013-11-19 |