Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8117001 | Measurement system for correcting overlay measurement error | Moon-sang Lee, Hong-Seok Kim, Kwan-Woo Kim, Seung Hyun Kim, Chan Hoon Park | 2012-02-14 |
| 7908105 | Measurement system for correcting overlay measurement error | Moon-sang Lee, Hong-Seok Kim, Kwan-Woo Kim, Seung Hyun Kim, Chan Hoon Park | 2011-03-15 |