Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12287295 | Method for estimating a quality function of a mono- or multi-layered coated transparent substrate | Yael BRONSTEIN, Xavier Caillet, Elsa PERRIN, Julien Beutier | 2025-04-29 |
| 11739417 | Method and a device for automatically determining adjustment values for operating parameters of a deposition line | Yohan Faucillon, Vojislav Gajic, Etienne Sandre-Chardonnal | 2023-08-29 |
| 11352691 | Method and device for locating the origin of a defect affecting a stack of thin layers deposited on a substrate | Bernard Nghiem, Yohan Faucillon, Gregoire Mathey | 2022-06-07 |
| 10843962 | Substrate provided with a stack having thermal properties | Jean-Carlos Lorenzzi | 2020-11-24 |