Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8380472 | Semiconductor yield management system and method | Weidong Wang | 2013-02-19 |
| 8190952 | Bitmap cluster analysis of defects in integrated circuits | Tom Ho, Weidong Wang, Xin Sun | 2012-05-29 |
| RE42481 | Semiconductor yield management system and method | Weidong Wang, David W. Budd | 2011-06-21 |
| 7954018 | Analysis techniques for multi-level memory | Tom Ho, Weidong Wang | 2011-05-31 |
| 7685481 | Bitmap cluster analysis of defects in integrated circuits | Tom Ho, Weidong Wang, Xin Sun | 2010-03-23 |
| 6768961 | System and method for analyzing error information from a semiconductor fabrication process | Weidong Wang | 2004-07-27 |
| 6470229 | Semiconductor yield management system and method | Weidong Wang, David W. Budd | 2002-10-22 |