Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9638782 | Probe card analysis system and method | Eric Endres, Christian Kuwasaki, Christopher McLaughlin | 2017-05-02 |
| 8466703 | Probe card analysis system and method | Eric Endres, Christian Kuwasaki, Christopher McLaughlin | 2013-06-18 |
| 8358831 | Probe mark inspection | Rodney Doe | 2013-01-22 |
| 8198906 | Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture | — | 2012-06-12 |
| 8089292 | System and method of measuring probe float | Raymond Kraft | 2012-01-03 |
| 7960981 | Apparatus for obtaining planarity measurements with respect to a probe card analysis system | Raymond Kraft | 2011-06-14 |
| 7750622 | Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis and manufacture | — | 2010-07-06 |
| 7634128 | Stereoscopic three-dimensional metrology system and method | Donald B. Snow, Raymond Kraft | 2009-12-15 |
| 7633306 | System and method of measuring probe float | Raymond Kraft | 2009-12-15 |
| 7634129 | Dual-axis scanning system and method | — | 2009-12-15 |
| 7579853 | Apparatus for obtaining planarity measurements with respect to a probe card analysis system | — | 2009-08-25 |
| 7385409 | System and method of mitigating effects of component deflection in a probe card analyzer | — | 2008-06-10 |
| 7231081 | Stereoscopic three-dimensional metrology system and method | Donald B. Snow, Raymond Kraft | 2007-06-12 |
| 7170307 | System and method of mitigating effects of component deflection in a probe card analyzer | — | 2007-01-30 |
| 7102368 | Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture | — | 2006-09-05 |
| 7062091 | Coordinate calibration for scanning systems | Carl S. Brown, Ray Kraft, Mark D. Cavelero | 2006-06-13 |
| 6621262 | Method for optimizing probe card analysis and scrub mark analysis data | — | 2003-09-16 |
| 6414477 | Method for optimizing probe card analysis and scrub mark analysis data | — | 2002-07-02 |