Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11740189 | Defining parameters for scan of single crystal structure | Scott Dufferwiel, Jonathan Eyre | 2023-08-29 |
| 11099143 | Method of detecting an anomaly in a single crystal structure | Scott Dufferwiel, Narcisa C. PINZARIU, Carlos Eduardo Mesquita Frias | 2021-08-24 |