TA

Takahiro Arakawa

Rohm Co.: 8 patents #378 of 2,292Top 20%
IC Ihi Inspection And Instrumentation Co.: 2 patents #5 of 36Top 15%
UN Unknown: 2 patents #12,644 of 83,584Top 20%
IC Ishikawajima-Harima Heavy Industries Co.: 2 patents #134 of 611Top 25%
TO Tadahiro Ohmi: 1 patents #22 of 65Top 35%
Fujitsu Limited: 1 patents #14,843 of 24,456Top 65%
WU Waseda University: 1 patents #116 of 411Top 30%
HI Hitachi: 1 patents #17,742 of 28,497Top 65%
KD Kabushiki Kaisha Dnaform: 1 patents #9 of 27Top 35%
Overall (All Time): #269,025 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
D1052545 Semiconductor device Aiko Miyazaki, Tomoyuki Kawakami, Satoshi Kobayashi 2024-11-26
D1043594 Semiconductor device Aiko Miyazaki, Tomoyuki Kawakami, Satoshi Kobayashi 2024-09-24
D1043595 Semiconductor device Aiko Miyazaki, Tomoyuki Kawakami, Satoshi Kobayashi 2024-09-24
11293905 Phased-array flaw-detection device and method Shintaro Fukumoto, Hiraku Kawasaki 2022-04-05
10957803 Bidirectional Zener diode and method for manufacturing bidirectional Zener diode Junya Yamagami 2021-03-23
10345268 Ultrasonic inspection device and method Hiraku Kawasaki, Tatsuya Hikichi, Saburou Shibata, Hideyuki Nakamura 2019-07-09
10066264 Method for analyzing target nucleic acid, kit, and analyzer Yoshihide Hayashizaki, Masayoshi Itoh, Kengo Usui, Sotaro Uemura, Yasumasa Mitani 2018-09-04
8741779 Plasma processing apparatus and plasma processing method Tadahiro Ohmi, Kazuhide Ino 2014-06-03
8513137 Plasma processing apparatus and plasma processing method Tadahiro Ohmi, Kazuhide Ino 2013-08-20
8414782 Process for producing fluorocarbon microstructure, fluorocarbon microstructure, and microsystem Hiroyuki Kusakawa, Shuichi Shoji 2013-04-09
8308897 Plasma processing apparatus and plasma processing method Tadahiro Ohmi, Kazuhide Ino 2012-11-13
7899792 Data-mismatch resolving apparatus, data-mismatch resolving method, and computer product Katsushi Wakiyama 2011-03-01
7719689 AE/ultrasound detection system, and material monitoring apparatus and nondestructive inspection apparatus equipped the system Jung Ryul Lee, Hiroshi Tsuda, Tomio Nakajima 2010-05-18
6693612 Liquid crystal display apparatus and its luminance control method Teruhiko Matsumoto, Hidenobu Funaki, Masae Matsuura, Akihiro Mori 2004-02-17
6640632 Ultrasonic flaw detection method and apparatus Hiroaki Hatanaka, Saburo Shibata 2003-11-04
6388632 Slot antenna used for plasma surface processing apparatus Shigehiro Murakawa, Kenji Tanaka 2002-05-14
4961347 Probe for ultrasonic flaw detectors Kazuo Yoshikawa, Yoshimichi Atsuta 1990-10-09