Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12284910 | Organic electroluminescent compound and organic electroluminescent device comprising the same | Hong-Se OH, Tae Jin LEE | 2025-04-22 |
| 12272073 | System and method for real-time object detection in video | Eui Nam Huh, Md. Alamgir Hossain, Dao Tan Tri Nguyen, Md. Delowar Hossain | 2025-04-08 |
| 12041845 | Organic electroluminescent compound and organic electroluminescent device comprising the same | Hyun Jung Kim, Jeong-Hwan JEON, Seon Jin Hwang, Hong-Se OH | 2024-07-16 |
| 11814401 | Luminescent material and electroluminescent display device using the same | Heejun Park, Jaemin Moon, Kusun Choung, Hee-Ryong Kang, Hyun Joo Kim +2 more | 2023-11-14 |
| 11788000 | Organic electroluminescent compound and organic electroluminescent device comprising the same | Sang-Hee CHO, Hee-Ryong Kang, Hong-Se OH, Jeong-Eun Yang | 2023-10-17 |
| 10276808 | Organic electroluminescent compound and organic electroluminescent device comprising the same | Hyun Jung Kim, Sung-Woo Jang | 2019-04-30 |
| 10033001 | Organic electroluminescent compound and organic electroluminescent device comprising the same | Hyun Joo Kim, So-Young JUNG, Sung-Woo Jang | 2018-07-24 |
| 7211488 | Method of forming inter-dielectric layer in semiconductor device | — | 2007-05-01 |
| 6943125 | Method for manufacturing semiconductor device | Jae Hoon Choi, Jae Chul Om, Sung-wook Park, Jae Hee Lee | 2005-09-13 |
| 6790685 | Method of forming a test pattern, method of measuring an etching characteristic using the same and a circuit for measuring the etching characteristic | — | 2004-09-14 |
| 6723589 | Method of manufacturing thin film transistor in semiconductor device | — | 2004-04-20 |