Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11125704 | Measurement system, program, and measurement system control method | Yu Aoki, Tatsuya Inoue, Hiroaki Kita | 2021-09-21 |
| 10883945 | Simultaneous multi-elements analysis type X-ray fluorescence spectrometer, and simultaneous multi-elements X-ray fluorescence analyzing method | Yu Aoki | 2021-01-05 |