Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7471766 | X-ray diffraction apparatus | — | 2008-12-30 |
| 7443952 | X-ray diffraction measurement method and X-ray diffraction apparatus | Koji Kakefuda | 2008-10-28 |
| 6748048 | Attachment of x-ray apparatus, high temperature attachment and x-ray apparatus | — | 2004-06-08 |
| 6285736 | Method for X-ray micro-diffraction measurement and X-ray micro-diffraction apparatus | — | 2001-09-04 |