TS

Tomio Sasaki

Ricoh Company: 12 patents #1,888 of 9,818Top 20%
DS Daini Seikosha: 1 patents #64 of 155Top 45%
NS Nippon Steel: 1 patents #2,111 of 4,423Top 50%
SC Seiko Electronic Components: 1 patents #18 of 47Top 40%
SI Seiko Instruments: 1 patents #836 of 1,437Top 60%
YC Yamaichi Electric Mfg. Co.: 1 patents #16 of 26Top 65%
Overall (All Time): #298,293 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
9372960 Medical support system and method thereof Kenei Shie, Katsuhiro Ogiwara, Takayuki Kohri, Yuji Nakajima, Guoliang Wang 2016-06-21
5556721 Non-aqueous electrolyte secondary battery and production method of the same Tsugio Sakai, Kensuke Tahara 1996-09-17
5408339 Image area discriminating device Shinji Kobayashi, Masahito Obata 1995-04-18
5363210 Apparatus outputting quantized image data, selecting from filters with different error spreading effects Masahito Obata 1994-11-08
5351138 Image area discriminating device Shinji Kobayashi, Masahito Obata 1994-09-27
5333211 Image processing apparatus for preventing occurrence of moire in a reconstructed image Yoshimichi Kanda, Hajime Ichimura, Shinji Yamakawa, Midori Aida, Ouji Maruyama +5 more 1994-07-26
5140440 Method of detecting a processing area of a document for an image forming apparatus 1992-08-18
4969051 Image processing apparatus 1990-11-06
4894727 Image processing system and method 1990-01-16
4864413 Image processing system having a selective magnification function 1989-09-05
4860117 Image processing method and system using multiple image sensors producing image data segments which are combined and subjected to optical processing 1989-08-22
4827350 Image reading apparatus having a plurality of image sensors Shinji Kobayashi 1989-05-02
4746299 IC connector Noriyuki Matsuoka 1988-05-24
4641272 Device for sensing sheet transport condition Yukio Noguchi 1987-02-03
4602778 Copying machine equipped with a correction apparatus for draft Hiroshi Hirose, Tokuzo Kaneda, Kunio Hibi, Hitoshi Hoshi 1986-07-29
4331872 Method for measurement of distribution of inclusions in a slab by electron beam irradiation Hiromu Soga, Koichi Kitamura, Mitsuyoshi Sato, Hiroshi Ishijima 1982-05-25