NM

Nobuhiro Morita

Ricoh Company: 13 patents #1,714 of 9,818Top 20%
HK Hamamatsu Photonics K.K.: 1 patents #936 of 1,436Top 70%
Overall (All Time): #329,880 of 4,157,543Top 8%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12197720 Information processing apparatus, information processing method, and recording medium for canceling disablement of input reception of a touch panel 2025-01-14
10044907 Information processing apparatus and method for the replacement of personal information in print documents Tomoyuki Nozawa, Yoshihiro Ogura, Mitsuru Satoh 2018-08-07
9992235 Information processing system and user authentication method Mitsuru Satoh, Tomoyuki Nozawa, Yoshihiro Ogura 2018-06-05
8760558 Compound lens imaging device Go Maruyama, Sadao Takahashi, Jun Watanabe, Toshimichi Hagiya, Shin Aoki +1 more 2014-06-24
8760501 Stereo camera apparatus and vehicle-mountable monitoring apparatus using same Shigeru Oohchida, Shin Aoki, Masahiro Fujimoto, Hideaki Hirai, Yasufumi Yamada 2014-06-24
8611614 Personal authentication device and electronic device Yuji Yamanaka, Shigeru Oouchida, Jun Watanabe, Shin Aoki, Tetsuya Sasaki 2013-12-17
8204282 Image input device and personal authentication device Yuji Yamanaka 2012-06-19
8085312 Image input apparatus, image input method, personal authentication apparatus, and electronic apparatus Yuji Yamanaka, Toshiyuki Iseki, Toshimichi Nasukawa, Shinichi Kosuga, Hiroaki Takahashi +1 more 2011-12-27
7274466 Method and apparatus for measuring dynamic configuration surface 2007-09-25
6885460 Apparatus for and method of measuring surface shape of an object 2005-04-26
6687521 Noninvasion biological optical measuring instrument, measured portion holding device, and method for manufacturing the same Katsuhiko Sato, Yukio Ueda, Toshihiko Mizuno, Shigeru Sakamoto, Koji Yamanaka +4 more 2004-02-03
6266141 Birefringence measuring apparatus and method of measuring birefringence 2001-07-24
5844670 Method of and systems for measuring eccentricity of an aspherical lens surface Masayuki Takai 1998-12-01
5548396 Method and apparatus for measuring eccentricity of aspherical lens having an aspherical surface on only one lens face Takeshi Tada 1996-08-20