Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8028255 | Semiconductor integrated circuit, semiconductor integrated circuit design support device, and semiconductor integrated circuit manufacturing method | Tomoki Satoi | 2011-09-27 |
| 7836370 | Scan test circuit, semiconductor integrated circuit and scan enable signal time control circuit | Tomoki Satoi | 2010-11-16 |
| 5706294 | Method of finding DC test point of an integrated circuit | Toshihiro Takahashi, Toshiya Murota | 1998-01-06 |