Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7539599 | Abnormality diagnosing method, condition appraisal apparatus, image forming apparatus, management apparatus and management system | Kunio Hasegawa, Yasuhiko Saka, Mitsuo Hasebe, Shigeru Mita | 2009-05-26 |