Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6955264 | Method of detecting protrusion of inspection object from palette and method of fabricating semiconductor device | Shinji Semba | 2005-10-18 |
| 6804387 | Pattern matching apparatus | Yoshikazu Sakaue | 2004-10-12 |
| 6738503 | Notch inspection apparatus and method based on shading pattern matching | Yoshikazu Sakaue | 2004-05-18 |
| 5384531 | Apparatus for inspecting characteristics of semiconductor chips | Mitsuru Yamazaki, Masakazu Yashiro | 1995-01-24 |