YF

Yukihisa Funatsu

RE Renesas Electronics: 3 patents #1,322 of 4,529Top 30%
NE Nec Electronics: 1 patents #715 of 1,789Top 40%
Overall (All Time): #1,095,179 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
12417812 Failure analysis device and failure analysis method Toru Ogushi, Sho Uesugi 2025-09-16
11193974 Failure diagnostic apparatus and failure diagnostic method Kazuki Shigeta 2021-12-07
8356218 Fault location estimation device, fault location estimation method, and program 2013-01-15
7844873 Fault location estimation system, fault location estimation method, and fault location estimation program for multiple faults in logic circuit 2010-11-30