Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11675005 | Semiconductor device and scan test method of the same | Tomoji Nakamura | 2023-06-13 |
| 9589893 | Semiconductor device, semiconductor device design method, semiconductor device design apparatus, and program | Masafumi TOMODA | 2017-03-07 |
| 9054120 | Semiconductor device, semiconductor device design method, semiconductor device design apparatus, and program | Masafumi TOMODA | 2015-06-09 |
| 8713508 | Semiconductor device, semiconductor device design method, semiconductor design apparatus, and program | Masafumi TOMODA | 2014-04-29 |
| 7683627 | Semiconductor device having a function of detection breakages on a periphery thereof | — | 2010-03-23 |