Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9217770 | Probe resistance measurement method and semiconductor device with pads for probe resistance measurement | Shigetomi Michimata, Masayuki Yanagisawa | 2015-12-22 |
| 8278935 | Probe resistance measurement method and semiconductor device with pads for probe resistance measurement | Shigetomi Michimata, Masayuki Yanagisawa | 2012-10-02 |
| 7791111 | Semiconductor device with an opening for cutting a fuse | Shoji Koyama | 2010-09-07 |