Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9341674 | Scan test circuit, test pattern generation control circuit, and scan test control method | Norihiro Yamada | 2016-05-17 |
| 9081058 | Scan test circuit, test pattern generation control circuit, and scan test control method | Norihiro Yamada | 2015-07-14 |
| 6836867 | Method of generating a pattern for testing a logic circuit and apparatus for doing the same | — | 2004-12-28 |
| 5719881 | Test pattern generating apparatus and method | — | 1998-02-17 |