| 8629481 |
Semiconductor integrated circuit device |
Asao Nishimura, Syouji Syukuri, Toshio Miyamoto |
2014-01-14 |
| 7910922 |
Semiconductor integrated circuit device and manufacture thereof |
Asao Nishimura, Syouji Syukuri, Toshio Miyamoto |
2011-03-22 |
| 7910960 |
Semiconductor integrated circuit device with a fuse circuit |
Asao Nishimura, Syouji Syukuri, Toshio Miyamoto |
2011-03-22 |
| 7550763 |
Semiconductor integrated circuit device and manufacture thereof |
Asao Nishimura, Syouji Syukuri, Toshio Miyamoto |
2009-06-23 |
| 7247879 |
Semiconductor integrated circuit device having particular testing pad arrangement |
Asao Nishimura, Syouji Syukuri, Toshio Miyamoto |
2007-07-24 |
| 6831294 |
Semiconductor integrated circuit device having bump electrodes for signal or power only, and testing pads that are not coupled to bump electrodes |
Asao Nishimura, Syouji Syukuri, Toshio Miyamoto |
2004-12-14 |