Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9222856 | Measurement of particle morphology using filtration | Jing Wang, David Y. H. Pui, Sheng-Chieh Chen | 2015-12-29 |
| 8181505 | Measurement system for the multidimensional aerosol characterization | Michael Mertler, Bernd Sachweh, Markus Linsenbühler, Michael Schäfer, David Y. H. Pui +2 more | 2012-05-22 |
| 7812306 | Instruments for measuring nanoparticle exposure | Andreas Trampe, David Y. H. Pui, Stanley L. Kaufman | 2010-10-12 |
| 7655945 | Real-time monitoring of particles in semiconductor vacuum environment | David Y. H. Pui, Yi Liu, Christof Asbach | 2010-02-02 |
| 7105042 | Apparatus for separating aerosols or particles from gases | Manfred Tumbrink, Frank Jordan, Christoph Kleinert | 2006-09-12 |
| 6230572 | Instrument for measuring and classifying nanometer aerosols | David Y. H. Pui, Da-Ren Chen, Frederick R. Quant, Gilmore J. Sem, Detlef Hummes +1 more | 2001-05-15 |