Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11073558 | Circuit having multiple scan modes for testing | Tzung-Jin Wu, Jeong-Fa Sheu, Po-Lin Chen, Ying-Yen Chen | 2021-07-27 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11073558 | Circuit having multiple scan modes for testing | Tzung-Jin Wu, Jeong-Fa Sheu, Po-Lin Chen, Ying-Yen Chen | 2021-07-27 |