Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4303341 | Optically testing the lateral dimensions of a pattern | Hans P. Kleinknecht | 1981-12-01 |
| 4239790 | Method of defining a photoresist layer | — | 1980-12-16 |
| 4211489 | Photomask alignment system | Hans P. Kleinknecht | 1980-07-08 |
| 4200396 | Optically testing the lateral dimensions of a pattern | Hans P. Kleinknecht | 1980-04-29 |