Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5377001 | Apparatus for surface inspection | Cosmas Malin, Edgar F. Steigmeier, Thomas Nesensohn, Harry L. Sawatzki | 1994-12-27 |
| 5377002 | Apparatus for surface inspections | Comas Malin, Edgar F. Steigmeier, Thomas Nesensohn, Harry L. Sawatzki, Gert Schmid | 1994-12-27 |
| 4598997 | Apparatus and method for detecting defects and dust on a patterned surface | Edgar F. Steigmeier | 1986-07-08 |
| 4526468 | Method for determining the phase of phase transformable light scattering material | Edgar F. Steigmeier | 1985-07-02 |
| 4391524 | Method for determining the quality of light scattering material | Edgar F. Steigmeier | 1983-07-05 |