Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4511800 | Optical reflectance method for determining the surface roughness of materials in semiconductor processing | Michael Duffy | 1985-04-16 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4511800 | Optical reflectance method for determining the surface roughness of materials in semiconductor processing | Michael Duffy | 1985-04-16 |