RJ

Randall W. Joyner

RTX (Raytheon): 11 patents #986 of 15,912Top 7%
Overall (All Time): #458,629 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10006756 Flexible reference system Zbigniew Przeszlo 2018-06-26
9927220 Datum transfer apparatus and method for inspecting coated components Thomas H. Rogers, James R. Murdock, Andrew J. Brinks, Michael A. Morden 2018-03-27
8942837 Method for inspecting a manufacturing device James Romanelli, Jeffrey S. Beattie, Jesse R. Boyer, Robert E. Erickson, Daniel A. Snyder +2 more 2015-01-27
8899115 Method and system for locating a laser vibrometer during non-contact scanning Jesse R. Boyer 2014-12-02
8883261 Artifacts, method of creating such artifacts and methods of using such artifacts Jesse R. Boyer, Jeffry K. Pearson 2014-11-11
8111907 Method for repeatable optical determination of object geometry dimensions and deviations Jesse R. Boyer, Jeffry K. Pearson, Benjamin W. Meissner, James Romanelli 2012-02-07
8105651 Artifacts, methods of creating such artifacts and methods of using such artifacts Jesse R. Boyer, Jeffry K. Pearson 2012-01-31
7869026 Targeted artifacts and methods for evaluating 3-D coordinate system measurement accuracy of optical 3-D measuring systems using such targeted artifacts Jesse R. Boyer, Jeffry K. Pearson, Joseph D. Drescher 2011-01-11
7778788 Scanner based optical inspection system Jesse R. Boyer 2010-08-17
7578178 Method of inspecting turbine internal cooling features using non-contact scanners Jesse R. Boyer, Benjamin W. Meissner, Stephen Doll 2009-08-25
7573586 Method and system for measuring a coating thickness Jesse R. Boyer, Gene P. Allocca, Jeffrey K. Pearson 2009-08-11