Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5973631 | Test circuit and method of trimming a unary digital-to-analog converter (DAC) in a subranging analog-to-digital converter (ADC) | Erick M. Hirata, Lloyd Frederick Linder, Adam Wu | 1999-10-26 |