Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7255719 | Wafer rotation device and edge flaw inspection apparataus having the device | Takashi Kanno | 2007-08-14 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7255719 | Wafer rotation device and edge flaw inspection apparataus having the device | Takashi Kanno | 2007-08-14 |