SJ

Stanley P. Johnson

QM Quest Metrology: 5 patents #1 of 7Top 15%
Overall (All Time): #578,072 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8410466 Non-contact component inspection system Lawrence J. Zagorsky 2013-04-02
8171611 Method for implementing a component positioning device 2012-05-08
8164758 Internal inspection system and method Phillip Dewayne Bondurant 2012-04-24
8039827 Apparatus and methods for measuring at least one physical characteristic of a threaded object Lawrence J. Zagorsky 2011-10-18
8035094 Methods for measuring at least one physical characteristic of a component Lawrence J. Zagorsky 2011-10-11
7777209 Product inspection system and a method for implementing same Lawrence J. Zagorsky 2010-08-17
7745805 Product inspection system and a method for implementing same that incorporates a correction factor Lawrence J. Zagorsky 2010-06-29
7227163 Product inspection system and a method for implementing same 2007-06-05
7128298 Component positioning device 2006-10-31