JL

Joseph C. LaPlaca

QI Quality Vision International: 2 patents #11 of 31Top 40%
🗺 New York: #48,759 of 115,490 inventorsTop 45%
Overall (All Time): #1,931,282 of 4,157,543Top 50%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10401165 Articulated head with multiple sensors for measuring machine Edward T. Polidor, Kenneth L. Sheehan 2019-09-03
10222207 Articulated head with multiple sensors for measuring machine Edward T. Polidor, Kenneth L. Sheehan 2019-03-05