Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10429522 | Electrostatic hole trapping radiation detectors | — | 2019-10-01 |
| 10338237 | Inductive radiation detector | — | 2019-07-02 |
| 10018738 | Inductive radiation detector | — | 2018-07-10 |
| 9110127 | Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor | — | 2015-08-18 |
| 8896338 | Electrical characterization of semiconductor materials | — | 2014-11-25 |
| 8232817 | Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor | — | 2012-07-31 |
| 7898280 | Electrical characterization of semiconductor materials | — | 2011-03-01 |
| 7663385 | Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor | — | 2010-02-16 |
| 6967490 | Real-time in-line testing of semiconductor wafers | Jerzy Ruzyllo | 2005-11-22 |
| 6924657 | Real-time in-line testing of semiconductor wafers | Jerzy Ruzyllo | 2005-08-02 |
| 6909302 | Real-time in-line testing of semiconductor wafers | Jerzy Ruzyllo | 2005-06-21 |
| 6803588 | Apparatus and method for rapid photo-thermal surfaces treatment | — | 2004-10-12 |
| 6388455 | Method and apparatus for simulating a surface photo-voltage in a substrate | Krzysztof E. Kamieniecki, Jeffrey L. Sauer, Janusz Butkiewicz | 2002-05-14 |
| 6325078 | Apparatus and method for rapid photo-thermal surface treatment | — | 2001-12-04 |
| 6315574 | Method for real-time in-line testing of semiconductor wafers | Jerzy Ruzyllo | 2001-11-13 |
| 6069017 | Method for real-time in-line testing of semiconductor wafers | Jerzy Ruzyllo | 2000-05-30 |
| 5661408 | Real-time in-line testing of semiconductor wafers | Jerzy Ruzyllo | 1997-08-26 |
| 5091691 | Apparatus for making surface photovoltage measurements of a semiconductor | William Goldfarb, Michael Wollowitz | 1992-02-25 |
| 5087876 | Apparatus and method for making surface photovoltage measurements of a semiconductor | Leszek Reiss | 1992-02-11 |
| 4891584 | Apparatus for making surface photovoltage measurements of a semiconductor | William Goldfarb, Mike Wollowitz | 1990-01-02 |
| 4873436 | Nondestructive readout of a latent electrostatic image formed on an insulating material | Leszek Reiss, William Goldfarb | 1989-10-10 |
| 4847496 | Nondestructive readout of a latent electrostatic image formed on an insulated material | — | 1989-07-11 |
| 4833324 | Nondestructive readout of a latent electrostatic image formed on an insulating material | William Goldfarb | 1989-05-23 |
| 4827212 | Noninvasive method and apparatus for characterization of semiconductors | — | 1989-05-02 |
| 4663526 | Nondestructive readout of a latent electrostatic image formed on an insulating material | — | 1987-05-05 |