| 6603542 |
High sensitivity optical inspection system and method for detecting flaws on a diffractive surface |
Jay Ormsby, Abdu Boudour, Sergey V. Broude, Lloyd Quackenbos |
2003-08-05 |
| 5814829 |
Multistation surface inspection system |
Sergey V. Broude, Nicholas Allen, Abdu Boudour, Carl Johnson, Pascal Miller +1 more |
1998-09-29 |
| 5717198 |
Pellicle reflectivity monitoring system having means for compensating for portions of light reflected by the pellicle |
Sergey V. Broude, Nicholas Allen, Abdu Boudour, Carl Johnson, Pascal Miller +1 more |
1998-02-10 |
| 5675409 |
Plate holder for a surface inspection system |
Sergey V. Broude, David C. Giroux, Abdu Boudour, Carl Johnson, Pascal Miller +2 more |
1997-10-07 |
| 5672885 |
Surface displacement detection and adjustment system |
Nicholas Allen, Abdu Broudour, Sergey V. Broude, Carl Johnson, Pascal Miller +2 more |
1997-09-30 |
| 5625193 |
Optical inspection system and method for detecting flaws on a diffractive surface |
Sergey V. Broude, Nicholas Allen, Abdu Boudour, Carl Johnson, Pascal Miller +1 more |
1997-04-29 |
| 5610719 |
Displacement detection system |
Nicholas Allen, Abdu Broudour, Sergey V. Broude, Carl Johnson, Pascal Miller +2 more |
1997-03-11 |
| 5602401 |
Data processing system and method for a surface inspection apparatus |
Sergey V. Broude, Nicholas Allen, Abdu Boudour, Carl Johnson, Pascal Miller +1 more |
1997-02-11 |
| 5389794 |
Surface pit and mound detection and discrimination system and method |
Nicholas Allen, Sergey V. Broude, Pascal Miller, Jay Ormsby, Bruno Rostaing +1 more |
1995-02-14 |
| 4943734 |
Inspection apparatus and method for detecting flaws on a diffractive surface |
Carl Johnson, Jay Ormsby, George S. Quackenbos, Sergey V. Broude, Abdu Bou dour |
1990-07-24 |
| 4794264 |
Surface defect detection and confirmation system and method |
George S. Quackenbos, Jay Ormsby, Sergey V. Broude, Koichi Nishine |
1988-12-27 |
| 4794265 |
Surface pit detection system and method |
George S. Quackenbos, Jay Ormsby, Sergey V. Broude, Koichi Nishine |
1988-12-27 |
| 4772127 |
Surface inspection apparatus |
Sergey V. Broude, George S. Quackenbos |
1988-09-20 |