Eric Chase — 13 Patents at Qc Optics

Eric Chase has been granted 13 US patents while listed as an inventor at Qc Optics. The first was granted in 1988 and the most recent in August 2003. Eric Chase ranks #362,438 of 4,157,543 US inventors in our database (top 8.7%). Patent records list Eric Chase in Andover, MA, US.

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
6603542	High sensitivity optical inspection system and method for detecting flaws on a diffractive surface	Jay Ormsby, Abdu Boudour, Sergey V. Broude, Lloyd Quackenbos	2003-08-05
5814829	Multistation surface inspection system	Sergey V. Broude, Nicholas Allen, Abdu Boudour, Carl Johnson, Pascal Miller +1 more	1998-09-29	$87,000
5717198	Pellicle reflectivity monitoring system having means for compensating for portions of light reflected by the pellicle	Sergey V. Broude, Nicholas Allen, Abdu Boudour, Carl Johnson, Pascal Miller +1 more	1998-02-10	$207,000
5675409	Plate holder for a surface inspection system	Sergey V. Broude, David C. Giroux, Abdu Boudour, Carl Johnson, Pascal Miller +2 more	1997-10-07	$246,000
5672885	Surface displacement detection and adjustment system	Nicholas Allen, Abdu Broudour, Sergey V. Broude, Carl Johnson, Pascal Miller +2 more	1997-09-30	$254,000
5625193	Optical inspection system and method for detecting flaws on a diffractive surface	Sergey V. Broude, Nicholas Allen, Abdu Boudour, Carl Johnson, Pascal Miller +1 more	1997-04-29	$103,000
5610719	Displacement detection system	Nicholas Allen, Abdu Broudour, Sergey V. Broude, Carl Johnson, Pascal Miller +2 more	1997-03-11	$200,000
5602401	Data processing system and method for a surface inspection apparatus	Sergey V. Broude, Nicholas Allen, Abdu Boudour, Carl Johnson, Pascal Miller +1 more	1997-02-11	$192,000
5389794	Surface pit and mound detection and discrimination system and method	Nicholas Allen, Sergey V. Broude, Pascal Miller, Jay Ormsby, Bruno Rostaing +1 more	1995-02-14
4943734	Inspection apparatus and method for detecting flaws on a diffractive surface	Carl Johnson, Jay Ormsby, George S. Quackenbos, Sergey V. Broude, Abdu Bou dour	1990-07-24
4794264	Surface defect detection and confirmation system and method	George S. Quackenbos, Jay Ormsby, Sergey V. Broude, Koichi Nishine	1988-12-27
4794265	Surface pit detection system and method	George S. Quackenbos, Jay Ormsby, Sergey V. Broude, Koichi Nishine	1988-12-27
4772127	Surface inspection apparatus	Sergey V. Broude, George S. Quackenbos	1988-09-20

Eric Chase — 13 Patents

Issued Patents All Time

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