Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Rakesh Dave — 12 Patents

QBQbase: 12 patents #4 of 10Top 40%
Dayton, OH: #113 of 1,892 inventorsTop 6%
Ohio: #6,508 of 73,341 inventorsTop 9%
Overall (All Time): #396,045 of 4,157,543Top 10%
12 Patents All Time
Rakesh Dave has been granted 12 US patents while listed as an inventor at Qbase. The first was granted in 2015 and the most recent in May 2018. Rakesh Dave ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Rakesh Dave in Dayton, OH, US.

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
9984427 Data ingestion module for event detection and increased situational awareness Sanjay Boddhu 2018-05-29
9922032 Featured co-occurrence knowledge base from a corpus of documents Scott Lightner, Sanjay Boddhu 2018-03-20
9910723 Event detection through text analysis using dynamic self evolving/learning module Sanjay Boddhu 2018-03-06
9542477 Method of automated discovery of topics relatedness Scott Lightner, Franz Weckesser, Sanjay Boddhu, Robert FLAGG 2017-01-10
9544361 Event detection through text analysis using dynamic self evolving/learning module Sanjay Boddhu 2017-01-10
9507834 Search suggestions using fuzzy-score matching and entity co-occurrence Scott Lightner, Franz Weckesser, Sanjay Boddhu, Joseph Becknell 2016-11-29
9424524 Extracting facts from unstructured text Sanjay Boddhu 2016-08-23
9239875 Method for disambiguated features in unstructured text Scott Lightner, Franz Weckesser, Sanjay Boddhu, Robert FLAGG 2016-01-19
9223833 Method for in-loop human validation of disambiguated features Scott Lightner, Sanjay Boddhu 2015-12-29
9208204 Search suggestions using fuzzy-score matching and entity co-occurrence Scott Lightner, Franz Weckesser, Sanjay Boddhu, Joseph Becknell 2015-12-08
9201931 Method for obtaining search suggestions from fuzzy score matching and population frequencies Scott Lightner, Franz Weckesser, Sanjay Boddhu 2015-12-01
9177254 Event detection through text analysis using trained event template models Sanjay Boddhu, Robert FLAGG, Scott Lightner 2015-11-03