Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5389786 | Method of quantitative determination of defect concentration on surfaces | Noriaki Itoh, Yasuo Nakai, Ken Hattori | 1995-02-14 |
| 5367980 | Method of producing defect-free perfect surfaces | Noriaki Itom, Yasuo Nakai, Ken Hattori, Junichi Kanasaki | 1994-11-29 |