Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12231565 | Login authentication method, apparatus, and system | Huitao Cheng | 2025-02-18 |
| 7382451 | Method of defect inspection | Chia-Yun Chen | 2008-06-03 |
| 7193698 | Wafer defect detection methods and systems | Li-Yu Chan | 2007-03-20 |
| 7132354 | Inspection methods for a semiconductor device | Hsien-Te Lo, Chia-Yun Chen | 2006-11-07 |
| 7071011 | Method of defect review | — | 2006-07-04 |
| 7020536 | Method of building a defect database | Feng-Ming Kuo, Su-Fen Cheng | 2006-03-28 |
| 6825119 | Method of piping defect detection | — | 2004-11-30 |
| 6807454 | Method for automatically controlling defect -specification in a semiconductor manufacturing process | Sheng-Jen Wang | 2004-10-19 |