FG

Frank D. Guiffrida

PI Pictometry International: 1 patents #29 of 39Top 75%
📍 Honeoye Falls, NY: #149 of 227 inventorsTop 70%
🗺 New York: #67,335 of 115,490 inventorsTop 60%
Overall (All Time): #3,259,045 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7995799 Method and apparatus for capturing geolocating and measuring oblique images Stephen L. Schultz, Robert Gray, Charles Mondello 2011-08-09