Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6226348 | X-ray diffractometer method for determining thickness of multiple non-metallic crystalline layers and fourier transform method | James A. Summers | 2001-05-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6226348 | X-ray diffractometer method for determining thickness of multiple non-metallic crystalline layers and fourier transform method | James A. Summers | 2001-05-01 |