Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12209940 | Apparatus and method to assess sub-micron particle levels of a sample | Gideon Drimer, Yitzhak Vanek | 2025-01-28 |
| 9752975 | Method and apparatus for determining cleanliness of a sample | Gideon Drimer, Yitzhak Vanek | 2017-09-05 |
| 9746409 | Method and apparatus for determining cleanliness of a sample | Yitzhak Vanek, Gideon Drimer | 2017-08-29 |
| 6179609 | Compact external torch assembly for semiconductor processing | Gideon Drimer, Nachum Borivker | 2001-01-30 |