Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4998819 | Topography measuring apparatus | Timothy F. Macri, Paul R. Yoder, Jr., David J. Valovich | 1991-03-12 |
| 4707734 | Coarse flaw detector for printed circuit board inspection | Natale F. Tinnerino, Timothy E. Bryant | 1987-11-17 |