JW

Jeffrey S. White

PE Perceptron: 4 patents #15 of 65Top 25%
PI Picometrix: 4 patents #3 of 18Top 20%
CI Cisco: 1 patents #7,901 of 13,007Top 65%
📍 Manchester, MI: #9 of 68 inventorsTop 15%
🗺 Michigan: #7,642 of 86,293 inventorsTop 9%
Overall (All Time): #401,334 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
11890505 Systems and methods for gestural detection and control in immersive and interactive flume swimming pools George Reid Evans, Marcelo Ortega, Enzo Pacilio 2024-02-06
10215696 System for determining at least one property of a sheet dielectric sample using terahertz radiation David Zimdars, Steven Williamson, Irl N. Duling, III 2019-02-26
9588041 System and method for detection and measurement of interfacial properties in single and multilayer objects Gregory D. Fichter, Irl N. Duling, III, David Zimdars 2017-03-07
9360296 System for calculation of material properties using reflection terahertz radiation and an external reference structure David Zimdars 2016-06-07
9270614 Quality of service for SIP-based data David Drab 2016-02-23
8457915 System and method to measure the transit time position(s) of pulses in time domain data Gregory D. Fichter, David Zimdars, Steven Williamson 2013-06-04
8152635 Providing network and game content based on wireless signals Justin Leingang 2012-04-10
D646329 Conversation starter console Richard Allen Lawrence, Amy L. W. Nappa, Joan Louise Schultz, Christine C. Yount Jones 2011-10-04
6769307 Method and system for processing measurement signals to obtain a value for a physical parameter John W. Dixon, Frederick P. LaPlant 2004-08-03
6481289 Method and system for processing measurement signals to obtain a value for physical parameter John W. Dixon, Frederick P. LaPlant 2002-11-19
6128081 Method and system for measuring a physical parameter of at least one layer of a multilayer article without damaging the article and sensor head for use therein Frederick P. LaPlant, John W. Dixon 2000-10-03
6092419 Method and system for processing measurement signals to obtain a value for a physical parameter John W. Dixon, Frederick P. LaPlant 2000-07-25