Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Charged-particle beam microscopy

Charged-particle beam microscopy

US Patent 9997331 · Granted Jun 12, 2018

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Charged-particle beam microscope with differential vacuum pressures2025
Charged-particle beam microscope with differential vacuum pressures2025
Coating of samples for microscopy2025
Scanning charged-particle-beam microscopy with energy-dispersive x-ray spectrosc2024
Scanning charged-particle-beam microscopy with energy-dispersive x-ray spectrosc2024
Coating of samples for microscopy2023
Microscopy2022
Microscopy2022
Positioning samples for microscopy, inspection, or analysis2022
Microscopy2020
Microscopy2020
Charged-particle beam microscope with an evaporator2018