Assignee
- Mettler-Toledo (Changzhou) Precision Instruments
- Mettler-Toledo (Changzhou) Measurement Technology
- Metter Toledo (Changzhou) Scale & System
Inventors
- Guojun Xie (12 patents)
- Guangping Xia (1 patents)
- Jingquan Yu (1 patents)
US Patent 9989566 · Granted Jun 5, 2018