Aparatus and method of determining a reaction sensitivity threshold of materials to elecrostatic discharge

Assignee

• The United States Of America, As Represented By The Secretary Of Homeland Security

Inventors

• David Hernandez (2 patents)
• David Hoey (2 patents)
• Joseph Eugene Chipuk, Jr. (1 patents)
• Benjamin Ostrow (1 patents)

View full patent text on Google Patents →