Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated circuits, methods of forming the same, and methods of determining gate dielectric layer electrical thickness in integrated circuits

Integrated circuits, methods of forming the same, and methods of determining gate dielectric layer electrical thickness in integrated circuits

US Patent 9911665 · Granted Mar 6, 2018

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

LDMOS device and fabrication method thereof2025
Touch display module and touch display device2025
Display module having adjustable integrated black effect and driving method ther2025
Display module and display device2025
Display device2025
Foldable holder and electronic device2025
Foldable support and electronic device2025
Display device2024
Display module and display device2024
Electronic shelf label2024
Electronic calendar2024
Display panel and display apparatus2024