Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for measuring the effect of microscopic hardware faults in high-complexity applications implemented in a hardware electronic system, and corresponding system and computer program product

Method for measuring the effect of microscopic hardware faults in high-complexity applications implemented in a hardware electronic system, and corresponding system and computer program product

US Patent 9898379 · Granted Feb 20, 2018

Estimated economic value: $17,556,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Independent safety monitoring of an automated driving system2025
Computing system for mitigating execution drift2025
Single chip multi-die architecture having safety-compliant cross-monitoring capa2023
Enhancing diagnostic capabilities of computing systems by combining variable pat2022
Functional safety controls based on soft error information2021
SoC architecture to integrate with one out of two diagnostics platforms2021
Core tightly coupled lockstep for high functional safety2021
Systems and methods for safety analysis including consideration of dependent fai2021
Functional safety over trace-and-debug2020
Method for executing programs in an electronic system for applications with func2020
Method of executing programs in an electronic system for applications with funct2019
Method for performing failure mode and effects analysis of an integrated circuit2011