Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › I/O control circuit for reduced pin count (RPC) device testing

I/O control circuit for reduced pin count (RPC) device testing

US Patent 9817064 · Granted Nov 14, 2017

Estimated economic value: $12,326,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

RDSON/dRON measurement method and circuit for high voltage HEMTs2022
Method for testing a high voltage transistor with a field plate2022
Testing solid state devices before completing manufacture2020
Automatic test equipment (ATE) platform translation2019
Spike safe floating current and voltage source2019
I/O control circuit for reduced pin count (RPC) device testing2018
Burn-in socket for packaged integrated circuits2017