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Home › Apparatus for built-in self-test (BIST) of a Nyquist rate analog-to-digital converter (ADC) circuit

Apparatus for built-in self-test (BIST) of a Nyquist rate analog-to-digital converter (ADC) circuit

US Patent 9780803 · Granted Oct 3, 2017

Estimated economic value: $5,870,000 ⓘ

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