Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin film

Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin film

US Patent 9780005 · Granted Oct 3, 2017

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Thin film transistor including oxide semiconductor layer2022
Thin film transistor and display device2020
Oxide sintered body and sputtering target, and method for producing same2019
Method for evaluating quality of oxide semiconductor thin film, method for manag2019
Method for evaluating quality of oxide semiconductor thin film, method for manag2019
Method for evaluating quality of oxide semiconductor thin film, method for manag2019
Oxide for semiconductor layer of thin film transistor, sputtering target, and th2019
Wiring structure for display device2019
Oxide for semiconductor layer of thin-film transistor, semiconductor layer of th2019
Quality evaluation method for laminate having protective layer on surface of oxi2019
Quality evaluation method for laminate having protective layer on surface of oxi2019
Evaluation method for oxide semiconductor thin film, quality control method for 2018