Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Electron microscope and method of measuring aberrations

Electron microscope and method of measuring aberrations

US Patent 9779911 · Granted Oct 3, 2017

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for image processing2022
Method of acquiring dark-field image2022
Image acquisition method and electron microscope2022
Deflector and charged particle beam system2022
Method of controlling transmission electron microscope and transmission electron2022
Cold cathode field-emission electron gun, adjustment method for cold cathode fie2021
Method of aberration measurement and electron microscope2021
Aberration measurement method and electron microscope2020
Measurement method and electron microscope2020
Objective lens and transmission electron microscope2019
Electron microscope and method of aberration measurement2018
Electron microscope and measurement method2018